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Electrochemical characteristics of a self-propagating molecular-based assembly.

Identifieur interne : 001A18 ( Main/Exploration ); précédent : 001A17; suivant : 001A19

Electrochemical characteristics of a self-propagating molecular-based assembly.

Auteurs : RBID : pubmed:20088551

Abstract

The electrochemical properties of a metallosupramolecular network that undergoes reversible redox chemistry on indium-tin oxide (ITO)-coated glass substrates have been investigated. The redox-active osmium complexes are electrochemically accessible even for films with a thickness > 15 nm. The electrochemical data correlates well with our previously observed self-propagating growth process, for which the electron density for the assemblies remains constant during film growth. Electron-transfer rate constants obtained by potential step chronoamperometry experiments suggest an exceptionally low attenuation factor, β, of 0.013 ± 0.001 Å(-1). However, the intrinsically porous nature of the assembly could be to a large extent or even entirely responsible for such a low value.

DOI: 10.1021/jp910898f
PubMed: 20088551

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<name sortKey="Motiei, Leila" uniqKey="Motiei L">Leila Motiei</name>
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<nlm:affiliation>Department of Organic Chemistry, The Weizmann Institute of Science, 76100 Rehovot, Israel.</nlm:affiliation>
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<name sortKey="Lahav, Michal" uniqKey="Lahav M">Michal Lahav</name>
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<name sortKey="Gulino, Antonino" uniqKey="Gulino A">Antonino Gulino</name>
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<name sortKey="Iron, Mark A" uniqKey="Iron M">Mark A Iron</name>
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<name sortKey="Van Der Boom, Milko E" uniqKey="Van Der Boom M">Milko E van der Boom</name>
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<div type="abstract" xml:lang="en">The electrochemical properties of a metallosupramolecular network that undergoes reversible redox chemistry on indium-tin oxide (ITO)-coated glass substrates have been investigated. The redox-active osmium complexes are electrochemically accessible even for films with a thickness > 15 nm. The electrochemical data correlates well with our previously observed self-propagating growth process, for which the electron density for the assemblies remains constant during film growth. Electron-transfer rate constants obtained by potential step chronoamperometry experiments suggest an exceptionally low attenuation factor, β, of 0.013 ± 0.001 Å(-1). However, the intrinsically porous nature of the assembly could be to a large extent or even entirely responsible for such a low value.</div>
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